The 3th IEEE International Conference on Pattern Recognition and Image Analysis, which will be held in Shahrekord (Iran) on April 18, 2017, invites proposals for half-day or full-day workshops. Workshops are assumed to focus on new research directions and novel applications of image analysis and pattern recognition. The purpose of the conference workshops is to give an opportunity in which participants can examine particular research areas in depth, consider novel research lines, discuss different application areas of image and pattern analysis and collect researchers from different fields with shared interests. The proposal form should be sent to Dr. Noushin Ghaderi in PDF format via email:

Download workshop form

Call for exhibition

The main purpose of Pattern Recognition and Image Analysis Conference is to establish the knowledge in the field of image and pattern analysis and to exchange the ideas by scholars and Industrialists. In addition, an essential part of the conference is presenting the scientific and industrial achievements.

In order to present a company, including its operation, performance and products, the conference organizing committee encourages all involved industrial exhibitors to fill the form and send it to Dr. Noushin Ghaderi via Email: , with the subject of exhibition request.

Download Exhibition form